ZMetrix Impedance Test Systems

ST600                                                          ST808

· Scanning TDR technology                                                  - New On-board Test capability
· Calibrated to NIST traceable standards                              - New Insertion-Loss Measurement capability
· Accurate over a wide range of measurement                      - New dual 10 & 20 Ghz. Bandwidth, 25 psec rise time
· Powered by a high speed USB connection                         - New Short Trace Measurement capability
· Single and Differential measurements                                - New line of High-Bandwidth Fixed-Pitch Probes
· Data collection and display software                                  - New line of High-Bandwidth Variable-Pitch Probes
· Statistical reporting of results                                             - Same Great ESD resistance as ST600 line